miliwicked.blogg.se

Crystaldiffract xrd files
Crystaldiffract xrd files






The bulk sample was annealed at 1200 ☌ for 24 hours followed by cooling at a rate of ∼2 ☌/min. X-ray diffraction (XRD), and scanning electron microscopy energy dispersive spectroscopy (SEM-EDS) were used to characterize the HEA composition NbTiVZr (chosen for investigation due to its relatively low thermal neutron absorption cross-section and potential use as a nuclear fuel cladding King, D.J.M., Cheung, S.T.Y., Humphry-Baker, S.A., Parkin, C., Couet, A., Cortie, M.B., Lumpkin, G.R., Middleburgh, S.C., and Knowles, A.J. This data is also qualitatively useful for diffusivity research as it shows that the sluggish diffusion, often claimed a HEA property, does not overpower the thermodynamically-driven chemical segregation of NbTiVZr at low temperatures. Google Scholar See all References], this data can be used to determined what the threshold cooling rate is required to achieve a single-phase. Google Scholar See all References, 2 x Senkov, O.N., V Senkova, S., Woodward, C., and Miracle, D.B. In combination with similar work on this system King, D.J.M., Cheung, S.T.Y., Humphry-Baker, S.A., Parkin, C., Couet, A., Cortie, M.B., Lumpkin, G.R., Middleburgh, S.C., and Knowles, A.J.

crystaldiffract xrd files

This data provides the scientific community with the knowledge that a single-phase is not achievable at ∼2 ☌/min for the NbTiVZr HEA. Single phase high-entropy alloys are of technological importance due to the simpler microstructure allowing for easier workability and ductility. University of Wisconsin- Madison, Madison, USAĭ.J.M. The resultant microstructure was analyzed using standard laboratory equipment.

crystaldiffract xrd files

EDS: no standardsĪnnealed in vacuum furnace w/slow cooling rate (1200° C, 2 ☌/min)īulk arc melted samples of NbTiVZr were annealed at 1200° C and furnace cooled. XRD was performed using a Bruker D8 Discover X-ray diffractometer, SEM/EDS was performed using a Zeiss LEO scanning electron microscope X-ray diffraction (XRD) intensity plots, scanning electron microscopy (SEM) micrographs, energy dispersion spectrograph EDS maps, EDS point-and-shoot compositions








Crystaldiffract xrd files